101 Metro Drive, Third Floor
San Jose, CA 95110
Ph: (408) 453-0146
Fx: (408) 573-7640
LogicVision's is a leading provider of Embedded Test solution that deliver a comprehensive intellectual property test capability addressing chip design, chip manufacturing, system level testing, and ongoing test and diagnosis of the final products.
Our Embedded Test technology simplifies the development and testing of complex semiconductors by solving test and diagnostics challenges at every stage of semiconductor design, production and application use. As complex chips are incorporated into boards, systems and end products, downstream customers can benefit from the Embedded Test solutions integrated in the devices to assist in the development, diagnosis and test of products. Once deployed in the field, LogicVision�s Embedded Test solution enables system self-test and debug at installation and allows for the repeated field test of the system components throughout the end product lifetime.
By using Embedded Test, companies minimize the need for capital- and labor-intensive external test. Embedded Test shortens time-to-market and greatly reduces test costs. In addition, the Embedded Test IP, once integrated, can be reused at chip, system and end product level to optimize quality, reliability and service.
President & CEO
Dr. Vinod Agarwal is the founder, president and CEO of LogicVision, Inc., a leading provider of embedded test solutions. Under his leadership, embedded test and built-in self-test have transitioned from being a curiosity to an emerging industry with products and solutions worth hundreds of millions of dollars. From 1978 to 1994, Vinod was on the faculty of the electrical engineering department at McGill University, Montreal, Canada, most recently as Nortel Industrial Research Chair Professor. He has authored and co-authored over 100 technical publications related to test, design and reliability of microelectronics components and systems. Vinod is also an inventor of several U.S. and Canadian patents. He was elected to the grade of Fellow of the Institute of Electrical and Electronics Engineers (IEEE) in 1992.