Eugene S. Meieran, Intel Fellow, is working on advanced manufacturing strategy development in Intel's Technology Manufacturing Group, with responsibility for introducing advanced technologies and applications into Intel's component manufacturing facilities to help improve manufacturing performance. He currently manages a small group working on Internet and operational modeling applications to help improve manufacturing performance.
Dr. Meieran was elected to the National Academy of Engineering in 1998 for his contributions to the manufacturing of integrated circuits. Election to the NAE is among the highest professional distinctions accorded an engineer.
Dr. Meieran joined Intel Corporation in 1973 as Manager of Package Development, with responsibility for developing new lines of plastic and hermetic packages for the emerging memory and microprocessor product lines. In 1977, he transferred to the Quality and Reliability Department, with responsibility for all Intel incoming materials quality, the newly established Materials Analysis Laboratories, and for key elements of the wafer fab and assembly quality and reliability functions. For several years, Dr. Meieran was responsible for all the Far-East and Caribbean assembly plant quality and reliability functions. In 1985, he was appointed as Intel Fellow, the second in the company's history.
Dr. Meieran has taught courses at Stanford University and the University of California at Berkeley, and has given seminars and invited talks to many universities throughout the world. He has published extensively in the fields of statistical process control, materials analysis and characterization technology, process and product reliability, and in advanced technology applications for manufacturing, with about 50 technical papers published in international journals. One of these was the Intel Quality and Reliability Handbook, which became an important contribution to the field of manufacturing quality and reliability concepts. He has been awarded three international Best Paper Awards based on technical talks presented on his work in semiconductor device reliability, with particular emphasis on the phenomena of electromigration in thin films, soft error upsets in dynamic random-access memory devices, and material analysis technology. Dr. Meieran founded and has been an active participant in the Electronic Materials Symposium since 1973, which sponsors an annual meeting in Santa Clara to discuss materials and processing technology for the industry, and he is the founder and Chair for the Ross Tucker Memorial Awards Committee, which for the past 23 years has donated two annual cash awards to San Francisco Bay-area university graduate students.
In 1987, he was elected as Distinguished Engineering Alumni by Purdue University, in recognition of his contributions to semiconductor device materials and processing technology.
He has been on the Scientific and Education Advisory Board for Lawrence Berkeley Labs, and is currently on the Advisory Boards for the Department of Electrical Engineering/Computer Science at UC Berkeley and the Materials Science Department for Purdue University. He was appointed as Director of Research for the MIT Leaders For Manufacturing Program in 1993, a position he currently holds. He has served on several government and industry panels dealing with manufacturing technology and policy issues, such as the Coalition for Intelligent Manufacturing Systems and the Next Generation Manufacturing Systems Advanced Manufacturing Systems board.
He is currently a member of the Intel Research Council and the Intel Academic Relations Council, and is Intel's representative to the Semiconductor Research Corp. (SRC) Factory Sciences Board. He has received two Intel Achievement Awards for his contributions to Intel.
Prior to joining Intel, Meieran was a Member of the Technical Staff at Fairchild Semiconductor Research and Development Laboratories in Palo Alto, CA, with responsibility for the materials analysis laboratories. He specialized in the use of x-ray, transmission and scanning electron microscopy methods for the analysis and characterization of semiconductor device materials.
Eugene S. Meieran received his B.S. Degree from Purdue University, West Lafayette, Indiana in 1959, and his M.S. and ScD degrees from the Massachusetts Institute of Technology, Cambridge, MA in 1961 and 1963, respectively, in the field of Material Science.